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1 | // © 2016 and later: Unicode, Inc. and others. | |
2 | // License & terms of use: http://www.unicode.org/copyright.html | |
3 | /******************************************************************** | |
4 | * COPYRIGHT: | |
5 | * Copyright (c) 1997-2011, International Business Machines Corporation and | |
6 | * others. All Rights Reserved. | |
7 | ********************************************************************/ | |
8 | ||
9 | ||
10 | #ifndef _PUTILTEST_ | |
11 | #define _PUTILTEST_ | |
12 | ||
13 | #include "intltest.h" | |
14 | ||
15 | /** | |
16 | * Test putil.h | |
17 | **/ | |
18 | class PUtilTest : public IntlTest { | |
19 | // IntlTest override | |
20 | void runIndexedTest( int32_t index, UBool exec, const char* &name, char* par ); | |
21 | public: | |
22 | ||
23 | // void testIEEEremainder(void); | |
24 | void testMaxMin(void); | |
25 | ||
26 | private: | |
27 | // void remainderTest(double x, double y, double exp); | |
28 | void maxMinTest(double a, double b, double exp, UBool max); | |
29 | ||
30 | // the actual tests; methods return the number of errors | |
31 | void testNaN(void); | |
32 | void testPositiveInfinity(void); | |
33 | void testNegativeInfinity(void); | |
34 | void testZero(void); | |
35 | ||
36 | // subtests of testNaN | |
37 | void testIsNaN(void); | |
38 | void NaNGT(void); | |
39 | void NaNLT(void); | |
40 | void NaNGTE(void); | |
41 | void NaNLTE(void); | |
42 | void NaNE(void); | |
43 | void NaNNE(void); | |
44 | ||
45 | }; | |
46 | ||
47 | #endif | |
48 | //eof |