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1 | /******************************************************************** |
2 | * COPYRIGHT: | |
4388f060 | 3 | * Copyright (c) 1997-2011, International Business Machines Corporation and |
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4 | * others. All Rights Reserved. |
5 | ********************************************************************/ | |
6 | ||
7 | ||
8 | #ifndef _PUTILTEST_ | |
9 | #define _PUTILTEST_ | |
10 | ||
11 | #include "intltest.h" | |
12 | ||
13 | /** | |
14 | * Test putil.h | |
15 | **/ | |
16 | class PUtilTest : public IntlTest { | |
17 | // IntlTest override | |
18 | void runIndexedTest( int32_t index, UBool exec, const char* &name, char* par ); | |
19 | public: | |
20 | ||
21 | // void testIEEEremainder(void); | |
22 | void testMaxMin(void); | |
23 | ||
24 | private: | |
25 | // void remainderTest(double x, double y, double exp); | |
26 | void maxMinTest(double a, double b, double exp, UBool max); | |
27 | ||
374ca955 A |
28 | // the actual tests; methods return the number of errors |
29 | void testNaN(void); | |
30 | void testPositiveInfinity(void); | |
31 | void testNegativeInfinity(void); | |
32 | void testZero(void); | |
33 | ||
34 | // subtests of testNaN | |
35 | void testIsNaN(void); | |
36 | void NaNGT(void); | |
37 | void NaNLT(void); | |
38 | void NaNGTE(void); | |
39 | void NaNLTE(void); | |
40 | void NaNE(void); | |
41 | void NaNNE(void); | |
42 | ||
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43 | }; |
44 | ||
45 | #endif | |
46 | //eof |